Microscopy

Analyte

Solid systems; systems with liquid phase
Composites, materials, organic and inorganic substances, thin layers

Equipment

• Device: GeminiSEM 300 (Zeiss), accelerating voltage 0,02 kV ... 30 kV
• Resolution: 0,8 nm at 15 kV
• Magnification: 12x - 2.000.000x
• Everhart-Thornley SE detector
• inLens detector
• ESB detector (energy-selective detector for back-scattering electrons)
• VP mode (low vacuum: 5 - 500 PA)
• Cryo transfer system Alto 2500
• EDX (energy dispersive x-ray microanalysis), Oxford Instruments X-Max 80 (Silcon Drift Detector)
• Digital image capture and archiving

Evaluation methods and targets

• Image analysis by image processing software (Olympus GmbH, Germany): determination of particle sizes and their distribution
• Morphology of fractures, cuts and surfaces with a resolution up to 10 nm
• Qualitative and quantitative elemental analysis
• Identification of morphological structures in materials from natural and synthetic polymers
• Investigation of structure-property-correlations depending on production and growth parameters, respectively, particularly natural polymers
• Investigation of liquid (particularly water-based) systems with cryo-SEM
• Determination of element composition of microstructures

Application examples

• Humid carbamate fibers: fracture morphology in cryo transfer technology (→ Image gallery)
• Microcapsules: surface and wall thickness (→ Image gallery)
• Composite: PLA-matrix with cellulose fibers, fracture morphology (→ Image gallery)
• Cryo-SEM of formation of pores and crystalline phases in cementitious binder systems