Surface analysis

Analyte

Surface of solids, incl. films, foils, sheets, powder, pellets, fibers, fabrics, etc.

• Sample size : > 0.3 mm x 0.7 mm
• Max. sample size: 30 mm x 60 mm x 19 mm
  
• Sampling depth : <~ 10 nm
• Sensitivity : 0.02 - 0.5 at %

Equipment

Kratos Axis Supra+

• X-ray sources: monochromatic Al anode, Al/Mg dual anode tube
• Sampling area: normal: 300 µm x 700 µm; microspot: 120 µm, 60 µm, 30 µm
• Chemical State Imaging, max. resolution ca. 2 µm
• Variable take-off angle
  
• Depth profiling with argon ions (for inorganics) or argon cluster ions for low-energy sputtering of organic materials

Result

• Concentration of elements (except for hydrogen and helium) at the surface
• Binding states of the elements, oxidation state, binding partners, functional groups
  
• Lateral and vertical distribution of these data

Applications

• Quality control for cleaning, activation, functionalization and coatings on surfaces
• Analysis of failures in adhesive joining, printing, coating, etc.
• Chemical analysis of coatings, adsorbate layers, surface contaminations, etc.
• Derivatization (labelling) techniques for the determination of functional groups on polymer surfaces
• Structural analysis of organic substances (e.g. substitution degree of polymers, composition of peptiden coatings)
  

Comparative and additional methods

• Fluorescence labelling (FL)
  
• Contact angle goniometry (CAG)
  
• Secondary ion mass spectrometry (SIMS)