Wide angle x-ray scattering (WAXS)
Analyte
- Native and man-made polymers, composites, basic material, inorganic matters
- Sample quantity: polymers: 0.5 cm3 - 1 cm3, inorganic matters: mg-range
Equipment
- X-ray diffraction instrument: two-circle diffractometer (D5000, Bruker-AXS)
- Monochromator: Ge(111) primary monochromator
- Wave length: Cu-Kα1; λ = 0.15406 nm
- Detector: scintillation counter
- Operation (standard): symmetrical transmission geometry
- Accessories: equipment for the investigation of liquids
- X-ray diffraction instrument: texture goniometer equipped with an closed Eulerian cradle (four-circle diffractometer, D5000, Bruker-AXS)
- Monochromator: Ni-filter
- Wave length: Cu-Kα; λ = 0.1542 nm
- Detector: scintillation counter
- Operation: transmission or reflection geometry
- X-ray diffraction instrument: flat-film camera
- Monochromator: Ni-filter
- Wave length: Cu-Kα; λ = 0.1542 nm
- Detector: X-ray film
- Operation (standard): transmission geometry
- Accessories: heater, small angle camera
Evaluation methods and targets
- Characterization of the supermolecular structure of native and man-made polymers
- Determination of the crystallinity and the crystallite sizes (adapted Ruland-Vonk-Verfahren, Fraunhofer IAP software WAXS VII)
- Characterization of the preferred orientation of polymers
- Recording of complete pole figures
- Determination of texture types from pole figures (transmission, reflection)
- Determination of quantitative orientational parameters
- Quantitative determination of fiber orientation (Herman´s orientation factor, Fraunhofer IAP-software)
- Qualitative characterization of the crystalline orientation from flat-film diagrams
- Qualitative and quantitative phase analysis
- Qualitative phase analysis using peak fitting; line profile analysis (Topas-P, Bruker-AXS)
- Quantitative phase analysis (line profile analysis by whole powder pattern fitting, Fraunhofer IAP-software)
- Quantitative Rietveld analysis (Topas-R, Bruker-AXS)
- Qualitative and quantitative phase analysis using X-ray flat-film diagrams
Applications
- Determination of the crystallinity and the crystallite sizes of pulps and starch
- Characterization of the orientation of cellulosic fibers, foils and casings
- Quantitative determination of the content of different modifications of a substance (e.g. phase analysis of cellulose I / II: fiber-reinforced sausage casings )
- Quantitative phase analysis of composites materials (e.g. quantitative analysis of the fiber content in fiber-reinforced composites)
- Quantitative Rietveld analysis of cement
Comparative and additional methods
- Small angle X-ray scattering (SAXS)
- Nuclear magnetic resonance spectroscopy (NMR)
- Scanning electron microscopy (SEM)
- Transmission electron microscopy (TEM)
- Optical microscopy (OM)
Fraunhofer Institute for 